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Han Leng
Senior Application Scientist at Onto Innovation
Professional Background
Han Leng is a distinguished Senior Application Scientist at Onto Innovation, where he specializes in developing advanced machine learning packages with graphical user interfaces tailored for semiconductor optical metrology. His comprehensive experience extends across various segments of data analysis, model maintenance, problem statement formalization, feature engineering, and the application of sophisticated machine learning algorithms. Han's focus is on designing scalable machine learning solutions that effectively address metrology challenges, particularly within the realm of ellipsometry, cementing his reputation as an innovative thinker in the industry.
Prior to his current role, Han contributed significantly as an Application Scientist at Onto Innovation, where he honed his skills and expanded his knowledge in optical metrology applications. His wealth of experience also includes a position as a Field Application Engineer - Metrology at KLA-Tencor, where he was instrumental in applying metrology solutions to enhance operational efficiencies in semiconductor manufacturing processes. His analytical prowess was further showcased during his tenure as a Research Assistant at Texas A&M University and Carnegie Mellon University, where his research efforts provided invaluable insights into materials science and engineering.
Education and Achievements
Han Leng's educational background is a testament to his commitment to excellence in the field of materials science. He earned his Ph.D. in Materials Science from Texas A&M University, achieving an impressive GPA of 3.70/4.0. During his doctoral studies, he was actively engaged in research that bridged theoretical knowledge with practical applications, paving the way for innovative advancements in materials processing and characterization.
Before his doctoral journey, Han completed his Master's Degree in Materials Science at Carnegie Mellon University, a program renowned for its rigorous curriculum and research opportunities. His foundational education was solidified with a Bachelor of Engineering in Materials Forming and Control Engineering from Northwestern Polytechnic University in China, where he achieved a commendable score of 81/100. This diverse educational pathway has equipped him with a robust understanding of the intricacies of materials science, particularly its applications in semiconductor technology.
Notable Achievements
Throughout his career, Han has received recognition for his innovative contributions in machine learning applications for semiconductor metrology. His ability to seamlessly integrate data-driven methodologies with practical engineering challenges has resulted in improved precision and efficiency in metrology solutions. His role at Onto Innovation has been pivotal, as he leads projects that push the boundaries of existing technology while addressing complex industry needs.
In addition, Han's research experiences at reputable institutions have enhanced his expertise in applying machine learning algorithms to real-world problems, particularly in optical applications. His former positions, including Research Intern at RTI International Metals and Manufacturing Engineering Intern at CHINA AVIATION INDUSTRY LIMITED, have provided him with a unique perspective on the entire lifecycle of materials engineering from conceptualization through to production. This breadth of experience allows Han to contribute meaningfully to discussions regarding future trends and technologies in semiconductor manufacturing and metrology.