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Edgar Genio

Product and Technology Development: Optical Systems , Software - System, Algorithms, Data (Acquisition to Analysis)
San Jose, California, United States
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Edgar Genio

Product and Technology Development: Optical Systems , Software - System, Algorithms, Data (Acquisition to Analysis)
San Jose, California, United States
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Edgar Genio is an accomplished technologist and physicist with a wealth of experience in optical and spectroscopic techniques, color measurements, thin film metrology, and software development. He has studied both at the University of Florida where he earned his Ph.D. in Physics and the University of the Philippines where he completed his B.S. in Physics.

Genio's professional experience and expertise centers around developing thin film metrology products and optical characterization techniques for quality control, process development, and yield improvement in the semiconductor, energy-efficient glass, solar, display, and packaging industries. He is well-versed in hardware and systems such as spectroscopic measurements (reflectance, transmission), thin film metrology, and automated metrology systems that can be used in various industries.

Additionally, Genio has extensive knowledge and skills in software development, including GUI systems, data processing, and data stores such as C#, C, WPF, .NET, and SQLite. He has developed algorithms such as standard numerical techniques, data analysis, and optimization/data-fitting techniques like Levenberg-Marquardt, as well as optical simulation of thin film stack optical response using transfer matrix methods (S-matrix formulation).

Before his current role as Principal Consultant, Genio held various positions such as VP and CTO at KunshanShengze, Professor at the Institute of Microelectronics, Chinese Academy of Sciences, VP Systems Integration at Institute of Microelectronics Chinese Academy of Sciences/Beioptics, Technologist at Applied Materials, Development Scientist at Boxer Cross Inc. (acquired by Applied Materials), and a post-doctoral scientist at the University of California Santa Barbara and BEST: JPL-NASA-UCSB Int'l Space Station Collaboration.

Overall, Genio has built an impressive career and possesses skills, knowledge, and experience that can be helpful to anyone interested in developing thin film metrology products and optical characterization techniques in diverse industries.

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This public profile is provided courtesy of Clay. All information found here is in the public domain.